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Advances in Imaging and Electron Physics: Silicon-Based Millimetre-Wave Technology Volume 174 (Hardcover)

Advances in Imaging and Electron Physics: Silicon-Based Millimetre-Wave Technology Volume 174 Cover Image
By Jamal Deen (Volume Editor)
$245.00
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Description


Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.
This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Product Details
ISBN: 9780123942982
ISBN-10: 0123942985
Publisher: Academic Press
Publication Date: November 27th, 2012
Pages: 484
Language: English
Series: Advances in Imaging and Electron Physics